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MAG*I*CAL, ultimate calibration standard for TEM
ProSciTech is proud to introduce the world's smallest ruler (5 micrometers) for the calibration of Transmission Electron Microscopes.
The MAG*I*CALĀ has been developed to perform the three major calibrations of a TEM.
- Image Magnification Calibration.
- Camera Constant Calibration for Indexing Diffraction Patterns.
- Image/Diffraction Pattern Rotation Calibration.
With this newly developed single crystal material, a single sample can replace up to 5 other calibration samples.
The sample consists of an ion milled cross section of a silicon single crystal.This consists of a series of atomically flat layers of Si and SiGe which have been grown epitaxially by MBE(molecular beam epitaxy). The thickness' and spacing of these layers are very accurately known and all other spacings on the sample are easily verified. The layer spacings are designed so that the sample can be used to calibrate the entire magnification range in a TEM-from 1000X to 1,000,000X. And, since the material is a single crystal, it can also be used to perform the camera constant calibration and the image diffraction pattern rotation calibration.
The sample comes with simple, specific instructions for all calibrations.
Figure 1. Diagram of the deluxe MAG*I*CAL calibration sample. The arrows indicate the four possible regions of interest on the sample where the calibration marks may be found. Note that this cross-sectional sample consist of two pieces of silicon wafer epoxied face-to-face, with additional silicon added as backing material to form a 3mm disk. To find the areas of interest at low magnification, look for the epoxy line on either side (between the arrows in the above figure).
Figure 2. TEM micrographs of the MAG*I*CAL calibration sample. The sample consists of a series of layers whose thickness are accurately known, based on the (111) lattice spacing of Si. Inset shows a higher magnification image of one of the layered structures.
