Tin-C test specimen on stub
Tin on Carbon is an alternate test specimen for medium resolution, and for the daily basic che...
Backscattered electron detector calibration standards
An electron microscope has the capacity to produce images in which contrast is controlled by t...
Standard test specimen set
Standard Test SpecimenThe Standard Test Specimen keeps the Scanning Electron Microsco...
Combined test specimen
Combined Test SpecimenA holey carbon film is shadowed with gold and graphitised carbo...
Chessy Test Specimen
A precise SEM test specimen for most all calibration applications.The Structure
Calibration reference - AFM SEM 750-HD -Ni, unmounted
High Durability Calibration Reference Specimen for AFM and STMEach specimen is supplied wi...
Grating replica on latex spheres
The latex sphere is 0.261um and the grating replica is 2160 lines/mm. Calibration aid allows t...
X-Checker calibration disc for SEM
The X-Checker was the first and remains the only complete calibration aid for SEM/EDS Systems....
Carbon grating replicas
Cross line pitch spacing of 463nm with 2160 lines/mm in both directions, cross at 90° for addi...
Calibration standard, model 70-1D
This Calibration Reference specimen comes with a non-traceable, manufacturer's certificate. Th...
