SEM double FIB sample and grid holder, pin mount

The SEM double FIB sample and grid holder with 3.2mm diameter pin stub base holds FIB samples mounted on two standard 12.7mm pin mounts for FIB milling and lift-out procedures and conveniently holds two FIB grids close to the sample to mount prepared TEM lamellae on the FIB grid for TEM imaging. Made from vacuum grade aluminium with brass screws. Includes Philips screwdriver #0. Compatible with FIB/SEM systems which accept pin mount holders, including the FEI, ZEISS and Tescan systems. For the JEOL and Hitachi systems, use a pin mount adapter.

Sizes:

• Overall size 36.5mm x 12.7mm x 11.6mm